University of Delaware

TRANSMISSION ELECTRON MICROSCOPY IN
MATERIALS SCIENCE

MSEG 823


 

The schedule presented below describes broadly the topics covered and their approximate sequence, however, it may be subject to drastic alteration from time to time.

Recommended text: "Transmission Electron Microscopy; A Textbook for Materials Science", D. B. Williams and C. Barry Carter.

Topics:

Introduction, overview of TEM and applications. Review of reciprocal space, stereographic projection, etc.
Electron optics, lenses. Basic optics, resolution, aberrations/corrections.
Electron sources. Alignment, practical operation. Imaging modes, lens rotation and calibration.
Diffraction patterns I: generation, indexing, single crystal patterns.
Kikuchi lines.
Diffraction patterns II: Fine structure
Kinematical Theory of electron diffraction. K.T. Image characteristics
Dynamical Theory of electron diffraction D.T. Image characteristics
Defect analysis, Burgers' vector analysis, fault analysis, stacking faults, planar precipitates.
STEM optics and applications. XMA, EELS,
Analytical EM. Convergent beam (CBED) and other microdiffraction techniques.
High Resolution Electron Microscopy (HREM)
Application examples in HREM and CBD.
Sample preparation, special techniques.

Examination #1 will take place in the week beginning Mar. 16th
Examination #2 will take place in the week beginning Apr. 13th
General

The course will include seminar-styles meetings and lectures integrated with extensive "virtual experience" with the JEOL 2010 electron microscope. The intention of the course is to give you the necessary theoretical basis in TEM so that you can begin to apply the microscope to your own research needs. To this end, the operation of the microscope, along with the theory of image formation and interpretation, will be covered in sufficient detail that you will have a firm foundation upon which to develop techniques relevant to your specific needs. It is clearly not possible to cover in depth all the techniques which may be encountered in TEM, however, if you have specific project-oriented needs, you should make them known early in the course since there is time to tailor the treatment of certain subjects to individual requirements. At the end of this course you should be a moderately competent, independent, and safeTEM "driver".

Virtual Laboratory Demonstrations

These will be arranged within the lecture course and will cover practical aspects of microscope operation.

Laboratory Exercises

The timetable for on-campus students completing these exercises will be flexibly arranged so that you will complete each exercise before moving on to the next. Both class meetings and exercises will be extensively supplemented with demonstrations whenever appropriate. Reports will be submitted for each exercise completed and, while they need not be in the usual format of complete laboratory reports, they must be presented in sufficient detail that they will be of use for revision and private study purposes later on. They will contain practical details of how the exercise was performed, detailed treatment of results and conclusions.

ONLY TYPED REPORTS WILL BE ACCEPTED.

These exercises/demonstrations form an important part of the course and will deal, among other things, with some of the following subjects:

(a) routine operation, e.g. filament saturation, illumination adjustment, magnification change
(b) photography
(c) astigmatism correction
(d) trace analysis
(e) foil thickness determination
(f) convergent beam patterns
(g) EDS analysis
(h) weak beam technique
Grading

The grading will be based on two midterm examinations (15% each), a final examination (25%), reports (30%) and term paper (15%). ± Grading will be used.

Texts

In addition to the recommended text, the following books are suggested as general supplemental reading in the field of TEM. The books by Edington (actually 5 Monographs) or Thomas & Goringe are perhaps the other most generally useful introductory texts.

J. W. Edington, Practical Electron Microscopy In Materials Science, Vols. 1-3 Philips Technical Library Monographs. Available from Tech Books.

P. Hirsch, A. Howie et al., Electron Microscopy of Thin Crystals, Butterworths. The original "Bible" of contrast theory etc., rather old but still the most frequently referenced volume on TEM.

G. Thomas and M. J. Goringe, Transmission Electron Microscopy of Materials, Wiley. Good general reading but not a very logical development of the topic.

J. J. Hren, J. I. Goldstein and D. Joy, Introduction to Analytical Electron Microscopy, Plenum.

M. H. Loretto, Electron Beam Analysis of Materials, Chapman & Hall.

C. E. Hall, Introduction to Electron Microscopy, McGraw-Hill. Old, but still eminently readable.

P. J. Grundy and G. A. Jones, Electron Microscopy in the Study of Materials, E. Arnold.

M. H. Loretto and R. E. Smallman, Defect Analysis in Electron Microscopy, Chapman & Hall. Beware of typo's!!

Ludwig Reimer, Transmission Electron Microscopy: Physics of Image Formation and Microanalysis.

D. B. Williams, Practical Analytical Electron Microscopy in Materials Science.

B. E. P. Beeston, R. W. Horne, and R. Markham, Electron Diffraction and Optical Diffraction Techniques.

S. K. Chapman, Maintaining and Monitoring the TEM. Great little book!

D. Chescoe and P. J. Goodhew, The Operation of the TEM.

J. C. H. Spence, Experimental High-Resolution Electron Microscopy. Excellent, but not easy reading.